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  • ATE测试中一种 Failed State 的快速修改方法 - 知乎
    其实这个问题在 v93k 的 Smart Test 己有解決方案。 它是通过获取 信号引脚 Fail 的状态，再设定需要修改成的状态，再进行一键修改。 这种修改的方法如下： 修改前提：v93k机台，Online 模式，测试的项存在failures。 1 修改 Result Storage Location 为：Extended-Memory。
  • User Manual Revision 0. 9. 2, March 2021 - multilaneinc. com
    If the clock is coming from the DUT or V93K, then all cassette instruments will be slaved to the external master clock In this case, the external differential clock should be cabled to the ^clock-in _
  • 关于ATE测试机台，memorybist以及ATPGfail点debug，help me，谢谢 - 讨论区 - EETOP 创芯网论坛 (原名 . . .
    出现了这种fail，先要看占多大比例，假如百分之十pass，基本说明pattern设计问题不大，可能是时序问题（当然，这里的百分比是乱说的）；假如百分之十fail，那就可能是制造问题，这个需要具体分析。
  • V93k Pattern_93k的测试pattern-CSDN博客
    通过pattern tool新建查看和编辑pattern，分析fail的cycle。 Timing setup是pattern setup的前提，timing没有准备好之前是没有办法setup pattern的。 基本名词 Single Vector ：有一个逻辑状态字符表示，对应一个cycle内的drive（0 1）和Compare（H L），每个Vector指向一个波形。
  • Penang Skills Development Centre (PSDC)
    Train students to use the V93K debug tools for device characterization and debug Understand ATE debug tools, concepts and techniques that can be applied to other ATE platforms (This course will use the Advantest V93K as a case study) Lab#2: Debug and root causing a real device failure
  • V93000 SmarTest 8 Product Engineering User Training
    This training will teach the student how to navigate through the V93000 ATE SmarTest environment, open, interpret and edit the necessary setup files for test suites in a test flow, identify, modify and execute characterization test suites, use Product Engineering tools (i e Shmoo, Margin, Analysis Tool) for results analysis, and how to utilize
  • ATE solutions to 3D-IC test challenges - ADVANTEST CORPORATION
    The Advantest V93K enables 128 separate clock domains for digital analog RF testing Separate clocking makes possible the Multiport and Concurrent test features of the V93K hardware and software This highly granular resource control allows mission mode test to be accomplished Improved test
  • MBIST (Memory Built-In Self-Test)
    Memory Built-In Self-Test (MBIST) is hardware built into chips to test memory elements automatically without requiring external ATE It’s optimized for fast production testing, designed to quickly identify faults during manufacturing
  • V93000 ATE Test Solutions - MultiLane
    The diagnostic kit is used to debug failing channels on MultiLane AT93000 ATE instruments AT93000-UBOX Free standing unit with Power and Air regulation and Ethernet Hub





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